Amplitude Modulation Atomic Force Microscopy - download pdf or read online

By Ricardo Garcia

ISBN-10: 3527408347

ISBN-13: 9783527408344

Filling a spot within the literature, this ebook gains in-depth discussions on amplitude modulation AFM, offering an summary of the idea, instrumental issues and functions of the procedure in either academia and undefined. As such, it comprises examples from fabric technological know-how, tender condensed topic, molecular biology, and biophysics, between others. The textual content is written in the sort of manner as to let readers from various backgrounds and degrees of workmanship to discover the data compatible for his or her wishes.

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To make a quantitative comparison with the experimental data it requires to determine the charging process occurring in surfaces. The DVLO theory is able to explain a variety of phenomena in colloidal stability. Double layer and van der Waals forces have remarkable differences. First, for similar surfaces one is repulsive and the other attractive. Second, double layer forces depend on the electrolyte concentration, while the ion concentration does not affect van der Waals interactions. Third, the van der Waals attraction overcomes the double layer repulsion at very small separations (1/d2 versus exp( d/lD)).

A variety of methods have been proposed [6, 42 50]; among them, the thermal noise and the Sader methods stand out because they are relatively easy to implement and provide values of the force constant with a relative error below 10% [45, 48]. A good introduction to the different calibration methods, and in particular to those described below, is provided by Cook et al. [48]. 1 Thermal Noise Method This method was first proposed by Hutter and Bechhoefer [42] and later refined by Butt and Jaschke [6].

Then, the electrostatic force is given by Fe ¼ 1 dC ðV 2 dz Vc Þ2 : ð3:24Þ The problem of calculating the electrostatic force is to determine the capacitance of the system for a realistic situation. This is a hard problem that involves a number of approximations that depend on the geometry of the interface [55 60]. A general expression for a conical tip of a half angle b capped with a half sphere of radius R is given by Fe ¼ pe0 ðV Vc Þ2 gðdÞ; ð3:25Þ j35 j 3 Tip Surface Interaction Forces 36 where e0 is the dielectric constant of the vacuum and g(d) is a geometrical factor that contains contributions from the tip’s apex, tip shank, and cantilever body [55, 57].

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Amplitude Modulation Atomic Force Microscopy by Ricardo Garcia

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