Download PDF by E. F. Skelton (auth.), Charles S. Barrett, John V.: Advances in X-Ray Analysis: Volume 31

By E. F. Skelton (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, John C. Russ, James W. Richardson Jr., Paul K. Predecki (eds.)

ISBN-10: 1461283035

ISBN-13: 9781461283034

ISBN-10: 1461310350

ISBN-13: 9781461310358

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Extra resources for Advances in X-Ray Analysis: Volume 31

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Consequently, this method has found its greatest application in heterogeneous materials such as composites or materials containing porosity. Tomography The best-known uses of X-rays for studying internal structure are those employed in the medical and dental professions, and in recent years the most publicized of the methods for reconstructing 2- and 3-D sections has been the "CAT" scanner. Computer Assisted (or Cross-Axial) Tomography is based, as we shall see, on fundamentals developed 70 years ago (Radon, 1917), but only developed to a practical level within the last 20 years.

J. Headley. 17 A . ROMIG, Jr . 313nm FIGURE 4 Lattice image of Si0 2 on Si. Courtesy of T. J . Headley. (111) lattice fringes in Si are visible. images are really intereference images. However, under proper conditions, the interference fringes have a one-to-one spatial correspondence to the actual lattice planes in the specimen . Such images are therefore called lattice images. Lattice images are usually generated from the transmitted beam and one diffracted beam. A typical lattice image is shown in Figure 4.

Quantification requires a bit more care and analysis, as is described below. All commercial AEM's available today use solid state, Li drifted Si, x-ray detectors, which is part of the energy dispersive spectrometer (EDS). A schematic of the solid state Si(Li) detector is shown in Figure 6. In the Si(Li) detector, x-rays strike a biased (-1000 V), liquid nitrogen (some current detectors are refrigerated) cooled, p-intrinsic-n Si crystal. 8 eV of energy in the incident x-ray. The bias sweeps the electronhole pairs apart creating a charge.

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Advances in X-Ray Analysis: Volume 31 by E. F. Skelton (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, John C. Russ, James W. Richardson Jr., Paul K. Predecki (eds.)

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